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this data sheet states amds current technical specifications regarding the product described herein. this data sheet may be revised by subsequent versions or modifications due to changes in technical specifications. publication# 21525 rev: d amendment/ +1 issue date: november 8, 2000 am29lv081b 8 megabit (1 m x 8-bit) cmos 3.0 volt-only uniform sector flash memory distinctive characteristics n single power supply operation 2.7 to 3.6 volt read and write operations for battery-powered applications n manufactured on 0.32 m process technology compatible with 0.5 m am29lv081 device n high performance access times as fast as 70 ns n ultra low power consumption (typical values at 5 mhz) 200 na automatic sleep mode current 200 na standby mode current 7 ma read current 15 ma program/erase current n flexible sector architecture sixteen 64 kbyte sectors supports full chip erase sector protection features: a hardware method of locking a sector to prevent any program or erase operations within that sector sectors can be locked in-system or via programming equipment temporary sector unprotect feature allows code changes in previously locked sectors n unlock bypass program command reduces overall programming time when issuing multiple program command sequences n embedded algorithms embedded erase algorithm automatically preprograms and erases the entire chip or any combination of designated sectors embedded program algorithm automatically writes and verifies data at specified addresses n minimum 1,000,000 write cycle guarantee per sector n 20-year data retention at 125 c reliable operation for the life of the system n package option 40-pin tsop n compatibility with jedec standards pinout and software compatible with single- power supply flash superior inadvertent write protection n data# polling and toggle bits provides a software method of detecting program or erase operation completion n ready/busy# pin (ry/by#) provides a hardware method of detecting program or erase cycle completion n erase suspend/erase resume suspends an erase operation to read data from, or program data to, a sector that is not being erased, then resumes the erase operation n hardware reset pin (reset#) hardware method to reset the device to reading array data n command sequence optimized for mass storage specific addresses not required for unlock cycles
2 am29lv081b general description the am29lv081b is an 8 mbit, 3.0 volt-only flash memory organized as 1,048,576 bytes. the device is offered in a 40-pin tsop package. the byte-wide (x8) data appears on dq7Cdq0. this device requires only a single, 3.0 volt v cc supply to perform read, program, and erase operations. a standard eprom programmer can also be used to program and erase the device. this device is manufactured using amds 0.32 m process technology, and offers all the features and ben- efits of the am29lv081, which was manufactured using 0.5 m process technology. in addition, the am29lv081b features unlock bypass programming and in-system sector protection/unprotection. the standard device offers access times of 70, 90, and 120 ns, allowing high speed microprocessors to operate without wait states. to eliminate bus contention the device has separate chip enable (ce#), write enable (we#) and output enable (oe#) controls. the device requires only a single 3.0 volt power sup- ply for both read and write functions. internally gener- ated and regulated voltages are provided for the program and erase operations. the device is entirely command set compatible with the jedec single-power-supply flash standard . com- mands are written to the command register using stan- dard microprocessor write timings. register contents serve as input to an internal state-machine that con- trols the erase and programming circuitry. write cycles also internally latch addresses and data needed for the programming and erase operations. reading data out of the device is similar to reading from other flash or eprom devices. device programming occurs by executing the program command sequence. this initiates the embedded program algorithman internal algorithm that auto- matically times the program pulse widths and verifies proper cell margin. the unlock bypass mode facili- tates faster programming times by requiring only two write cycles to program data instead of four. device erasure occurs by executing the erase command sequence. this initiates the embedded erase algo- rithman internal algorithm that automatically prepro- grams the array (if it is not already programmed) before executing the erase operation. during erase, the device automatically times the erase pulse widths and verifies proper cell margin. the host system can detect whether a program or erase operation is complete by observing the ry/by# pin, or by reading the dq7 (data# polling) and dq6 (toggle) status bits . after a program or erase cycle has been completed, the device is ready to read array data or accept another command. the sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. the device is fully erased when shipped from the factory. hardware data protection measures include a low v cc detector that automatically inhibits write opera- tions during power transitions. the hardware sector protection feature disables both program and erase operations in any combination of the sectors of mem- ory. this can be achieved in-system or via program- ming equipment. the erase suspend feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector that is not selected for erasure. true background erase can thus be achieved. the hardware reset# pin terminates any operation in progress and resets the internal state machine to reading array data. the reset# pin may be tied to the system reset circuitry. a system reset would thus also reset the device, enabling the system microprocessor to read the boot-up firmware from the flash memory. the device offers two power-saving features. when ad- dresses have been stable for a specified amount of time, the device enters the automatic sleep mode . the system can also place the device into the standby mode . power consumption is greatly reduced in both these modes. amds flash technology combines years of flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effective- ness. the device electrically erases all bits within a sector simultaneously via fowler-nordheim tunneling. the data is programmed using hot electron injection.
am29lv081b 3 table of contents product selector guide . . . . . . . . . . . . . . . . . . . . . 4 block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 connection diagrams . . . . . . . . . . . . . . . . . . . . . . 5 pin configuration . . . . . . . . . . . . . . . . . . . . . . . . . . 6 logic symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6 ordering information . . . . . . . . . . . . . . . . . . . . . . . 7 standard products .................................................................... 7 device bus operations . . . . . . . . . . . . . . . . . . . . . . 8 table 1. am29lv081b device bus operations ................................8 requirements for reading array data ..................................... 8 writing commands/command sequences .............................. 8 program and erase operation status ...................................... 9 standby mode .......................................................................... 9 automatic sleep mode ............................................................. 9 reset#: hardware reset pin ................................................. 9 output disable mode ................................................................ 9 table 2. am29lv081b sector address table ................................10 autoselect mode ..................................................................... 10 table 3. am29lv081b autoselect codes (high voltage method) ..10 sector protection/unprotection ............................................... 11 temporary sector unprotect .................................................. 11 hardware data protection ...................................................... 11 low v cc write inhibit .............................................................. 11 write pulse glitch protection ............................................... 11 logical inhibit .......................................................................... 11 power-up write inhibit ............................................................ 11 figure 1. temporary sector unprotect operation........................... 11 figure 2. in-system sector protect/unprotect algorithms .............. 12 command definitions . . . . . . . . . . . . . . . . . . . . . . 13 reading array data ................................................................ 13 reset command ..................................................................... 13 autoselect command sequence ............................................ 13 byte program command sequence ....................................... 13 unlock bypass command sequence ..................................... 14 chip erase command sequence ........................................... 14 figure 3. program operation .......................................................... 14 sector erase command sequence ........................................ 14 erase suspend/erase resume commands ........................... 15 figure 4. erase operation............................................................... 16 command definitions ............................................................. 17 table 4. am29lv081b command definitions .................................17 write operation status . . . . . . . . . . . . . . . . . . . . . 18 dq7: data# polling ................................................................. 18 figure 5. data# polling algorithm ................................................... 18 ry/by#: ready/busy# ........................................................... 19 dq6: toggle bit i .................................................................... 19 dq2: toggle bit ii ................................................................... 19 reading toggle bits dq6/dq2 ............................................... 19 figure 6. toggle bit algorithm........................................................ 20 dq5: exceeded timing limits ................................................ 20 dq3: sector erase timer ....................................................... 20 table 5. write operation status ..................................................... 21 absolute maximum ratings . . . . . . . . . . . . . . . . 22 figure 7. maximum negative overshoot waveform ...................... 22 figure 8. maximum positive overshoot waveform........................ 22 operating ranges . . . . . . . . . . . . . . . . . . . . . . . . . 22 dc characteristics . . . . . . . . . . . . . . . . . . . . . . . . 24 figure 9. i cc1 current vs. time (showing active and automatic sleep currents) ...................................................... 25 figure 10. typical i cc1 vs. frequency ........................................... 25 test conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 26 figure 11. test setup..................................................................... 26 table 6. test specifications ........................................................... 26 figure 12. input waveforms and measurement levels ................. 26 ac characteristics . . . . . . . . . . . . . . . . . . . . . . . . 27 read operations .................................................................... 27 figure 13. read operations timings ............................................. 27 hardware reset (reset#) .................................................... 28 figure 14. reset# timings .......................................................... 28 erase/program operations ..................................................... 29 figure 15. program operation timings .......................................... 30 figure 16. chip/sector erase operation timings .......................... 31 figure 17. data# polling timings (during embedded algorithms). 32 figure 18. toggle bit timings (during embedded algorithms)...... 32 figure 19. dq2 vs. dq6................................................................. 33 figure 20. temporary sector unprotect timing diagram .............. 33 figure 21. sector protect/unprotect timing diagram .................... 34 figure 22. alternate ce# controlled write operation timings ...... 36 erase and programming performance . . . . . . . 37 latchup characteristics . . . . . . . . . . . . . . . . . . . . 37 tsop pin capacitance . . . . . . . . . . . . . . . . . . . . . 37 data retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 physical dimensions . . . . . . . . . . . . . . . . . . . . . . 38 tsr04040-pin reverse tsop ........................................... 39 revision summary . . . . . . . . . . . . . . . . . . . . . . . . 40 revision a (december 1997) .................................................. 40 revision b (july 1998) ............................................................ 40 revision c (january 1999) ..................................................... 40 revision c+1 (may 17, 1999) ................................................. 40 revision d (november 19, 1999) ........................................... 40 revision d+1 (november 8, 2000) ......................................... 40
4 am29lv081b product selector guide note: see ac characteristics for full specifications. block diagram family part number am29lv081b speed options (v cc = 2.7C3.6 v) -70 -90 -120 max access time, ns (t acc ) 70 90 120 max ce# access time, ns (t ce ) 70 90 120 max oe# access time, ns (t oe ) 303550 input/output buffers x-decoder y-decoder chip enable output enable erase voltage generator pgm voltage generator timer v cc detector state control command register v cc v ss we# ce# oe# stb stb dq0 C dq7 sector switches ry/by# reset# data latch y-gating cell matrix address latch a0Ca19
am29lv081b 5 connection diagrams 1 16 2 3 4 5 6 7 8 17 18 19 20 9 10 11 12 13 14 15 40 25 39 38 37 36 35 34 33 32 31 30 29 28 27 26 24 23 22 21 a16 a5 a15 a14 a13 a12 a11 a9 a8 we# reset# nc ry/by# a18 a7 a6 a4 a3 a2 a1 a17 dq0 v ss nc a19 a10 dq7 dq6 dq5 oe# v ss ce# a0 dq4 v cc v cc nc dq3 dq2 dq1 1 16 2 3 4 5 6 7 8 17 18 19 20 9 10 11 12 13 14 15 40 25 39 38 37 36 35 34 33 32 31 30 29 28 27 26 24 23 22 21 a16 a5 a15 a14 a13 a12 a11 a9 a8 we# reset# nc ry/by# a18 a7 a6 a4 a3 a2 a1 a17 dq0 v ss nc a19 a10 dq7 dq6 dq5 ce# v ss ce# a0 dq4 v cc v cc nc dq3 dq2 dq1 reverse tsop standard tsop
6 am29lv081b pin configuration a0Ca19 = 20 addresses dq0Cdq7 = 8 data inputs/outputs ce# = chip enable oe# = output enable we# = write enable reset# = hardware reset pin, active low ry/by# = ready/busy# output v cc = 3.0 volt-only single power supply (see product selector guide for speed options and voltage supply tolerances) v ss = device ground nc = pin not connected internally logic symbol 20 8 dq0Cdq7 a0Ca19 ce# oe# we# reset# ry/by#
am29lv081b 7 ordering information standard products amd standard products are available in several packages and operating ranges. the order number (valid combi- nation) is formed by a combination of the elements below. valid combinations valid combinations list configurations planned to be sup- ported in volume for this device. consult the local amd sales office to confirm availability of specific valid combinations and to check on newly released combinations. am29lv081b -70 e c temperature range c= commercial (0c to +70c) i = industrial (C40 c to +85 c) e = extended (C55 c to +125 c) package type e = 40-pin thin small outline package (tsop) standard pinout (ts 040) f = 40-pin thin small outline package (tsop) reverse pinout (tsr040) speed option see product selector guide and valid combinations device number/description am29lv081b 8 megabit (1 m x 8-bit) uniform sector cmos flash memory 3.0 volt-only read, program and erase valid combinations am29lv081b-70 ec, ei, fc, fi am29lv081b-90 ec, ei, ee, fc, fi, fe am29lv081b-120
8 am29lv081b device bus operations this section describes the requirements and use of the device bus operations, which are initiated through the internal command register. the command register it- self does not occupy any addressable memory loca- tion. the register is composed of latches that store the commands, along with the address and data informa- tion needed to execute the command. the contents of the register serve as inputs to the internal state ma- chine. the state machine outputs dictate the function of the device. table 1 lists the device bus operations, the inputs and control levels they require, and the resulting output. the following subsections describe each of these operations in further detail. table 1. am29lv081b device bus operations legend: l = logic low = v il , h = logic high = v ih , v id = 12.0 0.5 v, x = dont care, a in = address in, d in = data in, d out = data out notes: 1. addresses are a19Ca0. 2. the sector protect and sector unprotect functions may also be implemented via programming equipment. see the sector protection/unprotection section. requirements for reading array data to read array data from the outputs, the system must drive the ce# and oe# pins to v il . ce# is the power control and selects the device. oe# is the output con- trol and gates array data to the output pins. we# should remain at v ih . the internal state machine is set for reading array data upon device power-up, or after a hardware reset. this ensures that no spurious alteration of the mem- ory content occurs during the power transition. no command is necessary in this mode to obtain array data. standard microprocessor read cycles that as- sert valid addresses on the device address inputs pro- duce valid data on the device data outputs. the device remains enabled for read access until the command register contents are altered. see reading array data for more information. refer to the ac read operations table for timing specifica- tions and to figure 13 for the timing diagram. i cc1 in the dc characteristics table represents the active cur- rent specification for reading array data. writing commands/command sequences to write a command or command sequence (which in- cludes programming data to the device and erasing sectors of memory), the system must drive we# and ce# to v il , and oe# to v ih . the device features an unlock bypass mode to facili- tate faster programming. once the device enters the un- lock bypass mode, only two write cycles are required to program a byte, instead of four. the byte program command sequence section has details on program- ming data to the device using both standard and unlock bypass command sequences. an erase operation can erase one sector, multiple sec- tors, or the entire device. table 2 indicate the address space that each sector occupies. a sector address consists of the address bits required to uniquely select a sector. the command definitions section has de- tails on erasing a sector or the entire chip, or suspend- ing/resuming the erase operation. after the system writes the autoselect command se- quence, the device enters the autoselect mode. the system can then read autoselect codes from the inter- operation ce# oe# we# reset# addresses (note 1) dq0Cdq7 read l l h h a in d out write l h l h a in d in standby v cc 0.3 v xx v cc 0.3 v x high-z output disable l h h h x high-z reset x x x l x high-z sector protect (note 2) l h l v id sector address, a6 = l, a1 = h, a0 = l x sector unprotect (note 2) l h l v id sector address, a6 = h, a1 = h, a0 = l x temporary sector unprotect x x x v id xx
am29lv081b 9 nal register (which is separate from the memory array) on dq7Cdq0. standard read cycle timings apply in this mode. refer to the autoselect mode and autoselect command sequence sections for more information. i cc2 in the dc characteristics table represents the ac- tive current specification for the write mode. the ac characteristics section contains timing specification tables and timing diagrams for write operations. program and erase operation status during an erase or program operation, the system may check the status of the operation by reading the status bits on dq7Cdq0. standard read cycle timings and i cc read specifications apply. refer to write operation status for more information, and to ac characteris- tics for timing diagrams. standby mode when the system is not reading or writing to the device, it can place the device in the standby mode. in this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, inde- pendent of the oe# input. the device enters the cmos standby mode when the ce# and reset# pins are both held at v cc 0.3 v. (note that this is a more restricted voltage range than v ih .) if ce# and reset# are held at v ih , but not within v cc 0.3 v, the device will be in the standby mode, but the standby current will be greater. the device requires standard access time (t ce ) for read access when the device is in either of these standby modes, before it is ready to read data. if the device is deselected during erasure or program- ming, the device draws active current until the operation is completed. when the reset# input is held at v ss 0.3 v, the de- vice enters the standby mode within a period of t rpd , tristates all data output pins, and ignores all read/write attempts for the duration of the reset# pulse. this mode is reset# controlled, since ce# is dont care under this condition. once the reset# pin is set high, the device requires t rh of wake up time in addi- tion to t ce access time for reading data. this method also terminates any operation in progress and resets the device. i cc3 in the dc characteristics table represents the standby current specification. automatic sleep mode the automatic sleep mode minimizes flash device energy consumption. the device automatically enables this mode when addresses remain stable for t acc + 30 ns. the automatic sleep mode is independent of the ce#, we#, and oe# control signals. standard address access timings provide new data when addresses are changed. while in sleep mode, output data is latched and always available to the system. i cc4 in the dc characteristics table represents the automatic sleep mode current specification. reset#: hardware reset pin the reset# pin provides a hardware method of reset- ting the device to reading array data. when the re- set# pin is driven low for at least a period of t rp , the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the reset# pulse. the device also resets the internal state ma- chine to reading array data. the operation that was in- terrupted should be reinitiated once the device is ready to accept another command sequence, to ensure data integrity. current is reduced for the duration of the reset# pulse. when reset# is held at v ss 0.3 v, the device draws cmos standby current (i cc4 ). if reset# is held at v il but not within v ss 0.3 v, the standby current will be greater. the reset# pin may be tied to the system reset cir- cuitry. a system reset would thus also reset the flash memory, enabling the system to read the boot-up firm- ware from the flash memory. if reset# is asserted during a program or erase op- eration, the ry/by# pin remains a 0 (busy) until the internal reset operation is complete, which requires a time of t ready (during embedded algorithms). the system can thus monitor ry/by# to determine whether the reset operation is complete. if reset# is asserted when a program or erase operation is not ex- ecuting (ry/by# pin is 1), the reset operation is completed within a time of t ready (not during embed- ded algorithms). the system can read data t rh after the reset# pin returns to v ih . refer to the ac characteristics tables for reset# pa- rameters and to figure 14 for the timing diagram. output disable mode when the oe# input is at v ih , output from the device is disabled. the output pins are placed in the high imped- ance state.
10 am29lv081b table 2. am29lv081b sector address table autoselect mode the autoselect mode provides manufacturer and de- vice identification, and sector protection verification, through identifier codes output on dq7Cdq0. this mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding programming algorithm. however, the autoselect codes can also be accessed in-system through the command register. when using programming equipment, the autoselect mode requires v id (11.5 v to 12.5 v) on address pin a9. address pins a6, a1, and a0 must be as shown in table 3. in addition, when verifying sector protection, the sec- tor address must appear on the appropriate highest order address bits (see table 2). table 3 shows the re- maining address bits that are dont care. when all nec- essary bits have been set as required, the programming equipment may then read the corresponding identifier code on dq7Cdq0. to access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in table 4. this method does not require v id . see command definitions for details on using the autoselect mode. table 3. am29lv081b autoselect codes (high voltage method) l = logic low = v il , h = logic high = v ih , sa = sector address, x = dont care. a19 a18 a17 a16 a15 a14 a13 sector size address range sa00000xxx 64 kbytes 00000h-0ffffh sa10001xxx 64 kbytes 10000h-1ffffh sa20010xxx 64 kbytes 20000h-2ffffh sa30011xxx 64 kbytes 30000h-3ffffh sa40100xxx 64 kbytes 40000h-4ffffh sa50101xxx 64 kbytes 50000h-5ffffh sa60110xxx 64 kbytes 60000h-6ffffh sa70111xxx 64 kbytes 70000h-7ffffh sa81000xxx 64 kbytes 80000h-8ffffh sa91001xxx 64 kbytes 90000h-9ffffh sa101010xxx 64 kbytes a0000h-affffh sa111011xxx 64 kbytes b0000h-bffffh sa121100xxx 64 kbytes c0000h-cffffh sa131101xxx 64 kbytes d0000h-dffffh sa141110xxx 64 kbytes e0000h-effffh sa151111xxx 64 kbytes f0000h-fffffh description ce# oe# we# a19 to a13 a12 to a10 a9 a8 to a7 a6 a5 to a2 a1 a0 dq7 to dq0 manufacturer id : amd l l h x x v id xlxll 01h device id: am29lv081b l l h x x v id xlxlh 38h sector protection verification l l h sa x v id xlxhl 01h (protected) 00h (unprotected)
am29lv081b 11 sector protection/unprotection the hardware sector protection feature disables both program and erase operations in any sector. the hard- ware sector unprotection feature re-enables both pro- gram and erase operations in previously protected sectors. sector protection/unprotection can be imple- mented via two methods. the primary method requires v id on the reset# pin only, and can be implemented either in-system or via programming equipment. figure 2 shows the algo- rithms and figure 21 shows the timing diagram. this method uses standard microprocessor bus cycle tim- ing. for sector unprotect, all unprotected sectors must first be protected prior to the first sector unprotect write cycle. the alternate method intended only for programming equipment requires v id on address pin a9, oe#, and reset#. this method is compatible with programmer routines written for earlier 3.0 volt-only amd flash de- vices. publication number 21225 contains further de- tails; contact an amd representative to request a copy. the device is shipped with all sectors unprotected. amd offers the option of programming and protecting sectors at its factory prior to shipping the device through amds expressflash? service. contact an amd representative for details. it is possible to determine whether a sector is protected or unprotected. see autoselect mode for details. temporary sector unprotect this feature allows temporary unprotection of previ- ously protected sectors to change data in-system. the sector unprotect mode is activated by setting the re- set# pin to v id . during this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. once v id is removed from the re- set# pin, all the previously protected sectors are protected again. figure 1 shows the algorithm, and figure 20 shows the timing diagrams, for this feature. hardware data protection the command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes (refer to table 4 for com- mand definitions). in addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during v cc power-up and power-down transitions, or from system noise. low v cc write inhibit when v cc is less than v lko , the device does not ac- cept any write cycles. this protects data during v cc power-up and power-down. the command register and all internal program/erase circuits are disabled, and the device resets. subsequent writes are ignored until v cc is greater than v lko . the system must provide the proper signals to the control pins to prevent uninten- tional writes when v cc is greater than v lko . write pulse glitch protection noise pulses of less than 5 ns (typical) on oe#, ce# or we# do not initiate a write cycle. logical inhibit write cycles are inhibited by holding any one of oe# = v il , ce# = v ih or we# = v ih . to initiate a write cycle, ce# and we# must be a logical zero while oe# is a logical one. power-up write inhibit if we# = ce# = v il and oe# = v ih during power up, the device does not accept commands on the rising edge of we#. the internal state machine is automatically reset to reading array data on power-up. figure 1. temporary sector unprotect operation start perform erase or program operations reset# = v ih temporary sector unprotect completed (note 2) reset# = v id (note 1) notes: 1. all protected sectors unprotected. 2. all previously protected sectors are protected once again.
12 am29lv081b figure 2. in-system sector protect/unprotect algorithms sector protect: write 60h to sector address with a6 = 0, a1 = 1, a0 = 0 set up sector address wait 150 s verify sector protect: write 40h to sector address with a6 = 0, a1 = 1, a0 = 0 read from sector address with a6 = 0, a1 = 1, a0 = 0 start plscnt = 1 reset# = v id wait 1 m s first write cycle = 60h? data = 01h? remove v id from reset# write reset command sector protect complete yes yes no plscnt = 25? yes device failed increment plscnt temporary sector unprotect mode no sector unprotect: write 60h to sector address with a6 = 1, a1 = 1, a0 = 0 set up first sector address wait 15 ms verify sector unprotect: write 40h to sector address with a6 = 1, a1 = 1, a0 = 0 read from sector address with a6 = 1, a1 = 1, a0 = 0 start plscnt = 1 reset# = v id wait 1 m s data = 00h? last sector verified? remove v id from reset# write reset command sector unprotect complete yes no plscnt = 1000? yes device failed increment plscnt temporary sector unprotect mode no all sectors protected? yes protect all sectors: the indicated portion of the sector protect algorithm must be performed for all unprotected sectors prior to issuing the first sector unprotect address set up next sector address no yes no yes no no yes no sector protect algorithm sector unprotect algorithm first write cycle = 60h? protect another sector? reset plscnt = 1
am29lv081b 13 command definitions writing specific address and data commands or se- quences into the command register initiates device op- erations. table 4 defines the valid register command sequences. writing incorrect address and data val- ues or writing them in the improper sequence resets the device to reading array data. all addresses are latched on the falling edge of we# or ce#, whichever happens later. all data is latched on the rising edge of we# or ce#, whichever happens first. refer to the appropriate timing diagrams in the ac characteristics section. reading array data the device is automatically set to reading array data after device power-up. no commands are required to retrieve data. the device is also ready to read array data after completing an embedded program or em- bedded erase algorithm. after the device accepts an erase suspend com- mand, the device enters the erase suspend mode. the system can read array data using the standard read timings, except that if it reads at an address within erase-suspended sectors, the device outputs status data. after completing a programming opera- tion in the erase suspend mode, the system may once again read array data with the same exception. see erase suspend/erase resume commands for more information on this mode. the system must issue the reset command to re-en- able the device for reading array data if dq5 goes high, or while in the autoselect mode. see the reset com- mand section, next. see also requirements for reading array data in the device bus operations section for more information. the read operations table provides the read parame- ters, and figure 13 shows the timing diagram. reset command writing the reset command to the device resets the de- vice to reading array data. address bits are dont care for this command. the reset command may be written between the se- quence cycles in an erase command sequence before erasing begins. this resets the device to reading array data. once erasure begins, however, the device ig- nores reset commands until the operation is complete. the reset command may be written between the se- quence cycles in a program command sequence be- fore programming begins. this resets the device to reading array data (also applies to programming in erase suspend mode). once programming begins, however, the device ignores reset commands until the operation is complete. the reset command may be written between the se- quence cycles in an autoselect command sequence. once in the autoselect mode, the reset command must be written to return to reading array data (also applies to autoselect during erase suspend). if dq5 goes high during a program or erase operation, writing the reset command returns the device to read- ing array data (also applies during erase suspend). autoselect command sequence the autoselect command sequence allows the host system to access the manufacturer and devices codes, and determine whether or not a sector is protected. table 4 shows the address and data requirements. this method is an alternative to that shown in table 3, which is intended for prom programmers and requires v id on address bit a9. the autoselect command sequence is initiated by writ- ing two unlock cycles, followed by the autoselect com- mand. the device then enters the autoselect mode, and the system may read at any address any number of times, without initiating another command sequence. a read cycle at address 00h retrieves the manufacturer code. a read cycle at address 01h returns the device code. a read cycle containing a sector address (sa) and the address 02h returns 01h if that sector is pro- tected, or 00h if it is unprotected. refer to table 2 for valid sector addresses. the system must write the reset command to exit the autoselect mode and return to reading array data. byte program command sequence the byte program command sequence programs one byte into the device. programming is a four-bus-cycle operation. the program command sequence is initi- ated by writing two unlock write cycles, followed by the program set-up command. the program address and data are written next, which in turn initiate the embed- ded program algorithm. the system is not required to provide further controls or timings. the device auto- matically generates the program pulses and verifies the programmed cell margin. table 4 shows the address and data requirements for the byte program command sequence. when the embedded program algorithm is complete, the device then returns to reading array data and ad- dresses are no longer latched. the system can deter- mine the status of the program operation by using dq7, dq6, or ry/by#. see write operation status for in- formation on these status bits. any commands written to the device during the em- bedded program algorithm are ignored. note that a hardware reset immediately terminates the program- ming operation. the byte program command se-
14 am29lv081b quence should be reinitiated once the device has reset to reading array data, to ensure data integrity. programming is allowed in any sequence and across sector boundaries. a bit cannot be programmed from a 0 back to a 1. attempting to do so may halt the operation and set dq5 to 1, or cause the data# polling algorithm to indicate the operation was suc- cessful. however, a succeeding read will show that the data is still 0. only erase operations can convert a 0 to a 1. unlock bypass command sequence the unlock bypass feature allows the system to pro- gram bytes to the device faster than using the standard program command sequence. the unlock bypass com- mand sequence is initiated by first writing two unlock cycles. this is followed by a third write cycle containing the unlock bypass command, 20h. the device then en- ters the unlock bypass mode. a two-cycle unlock by- pass program command sequence is all that is required to program in this mode. the first cycle in this se- quence contains the unlock bypass program com- mand, a0h; the second cycle contains the program address and data. additional data is programmed in the same manner. this mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total program- ming time. table 4 shows the requirements for the com- mand sequence. during the unlock bypass mode, only the unlock by- pass program and unlock bypass reset commands are valid. to exit the unlock bypass mode, the system must issue the two-cycle unlock bypass reset com- mand sequence. the first cycle must contain the data 90h; the second cycle the data 00h. the device then re- turns to reading array data. figure 3 illustrates the algorithm for the program oper- ation. see the erase/program operations table in ac characteristics for parameters, and to figure 15 for timing diagrams. chip erase command sequence chip erase is a six bus cycle operation. the chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the embedded erase algorithm. the device does not require the system to preprogram prior to erase. the embedded erase algo- rithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. the system is not required to provide any con- trols or timings during these operations. table 4 shows the address and data requirements for the chip erase command sequence. any commands written to the chip during the embed- ded erase algorithm are ignored. note that a hardware reset during the chip erase operation immediately ter- minates the operation. the chip erase command se- quence should be reinitiated once the device has returned to reading array data, to ensure data integrity. the system can determine the status of the erase op- eration by using dq7, dq6, dq2, or ry/by#. see write operation status for information on these sta- tus bits. when the embedded erase algorithm is com- plete, the device returns to reading array data and addresses are no longer latched. figure 4 illustrates the algorithm for the erase opera- tion. see the erase/program operations tables in ac characteristics for parameters, and to figure 16 for timing diagrams. sector erase command sequence sector erase is a six bus cycle operation. the sector erase command sequence is initiated by writing two un- lock cycles, followed by a set-up command. two addi- tional unlock write cycles are then followed by the address of the sector to be erased, and the sector start write program command sequence data poll from system verify data? no yes last address? no yes programming completed increment address embedded program algorithm in progress note: see table 4 for program command sequence. figure 3. program operation
am29lv081b 15 erase command. table 4 shows the address and data requirements for the sector erase command sequence. the device does not require the system to preprogram the memory prior to erase. the embedded erase algo- rithm automatically programs and verifies the sector for an all zero data pattern prior to electrical erase. the system is not required to provide any controls or tim- ings during these operations. after the command sequence is written, a sector erase time-out of 50 s begins. during the time-out period, additional sector addresses and sector erase com- mands may be written. loading the sector erase buffer may be done in any sequence, and the number of sec- tors may be from one sector to all sectors. the time be- tween these additional cycles must be less than 50 s, otherwise the last address and command might not be accepted, and erasure may begin. it is recommended that processor interrupts be disabled during this time to ensure all commands are accepted. the interrupts can be re-enabled after the last sector erase command is written. if the time between additional sector erase commands can be assumed to be less than 50 s, the system need not monitor dq3. any command other than sector erase or erase suspend during the time-out period resets the device to reading array data. the system must rewrite the command sequence and any additional sector addresses and commands. the system can monitor dq3 to determine if the sector erase timer has timed out. (see the dq3: sector erase timer section.) the time-out begins from the rising edge of the final we# pulse in the command sequence. once the sector erase operation has begun, only the erase suspend command is valid. all other commands are ignored. note that a hardware reset during the sector erase operation immediately terminates the op- eration. the sector erase command sequence should be reinitiated once the device has returned to reading array data, to ensure data integrity. when the embedded erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. the system can determine the sta- tus of the erase operation by using dq7, dq6, dq2, or ry/by#. (refer to write operation status for informa- tion on these status bits.) figure 4 illustrates the algorithm for the erase opera- tion. refer to the erase/program operations tables in the ac characteristics section for parameters, and to figure 16 for timing diagrams. erase suspend/erase resume commands the erase suspend command allows the system to in- terrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. this command is valid only during the sector erase operation, including the 50 s time-out period during the sector erase command sequence. the erase suspend command is ignored if written during the chip erase operation or embedded program algo- rithm. writing the erase suspend command during the sector erase time-out immediately terminates the time-out period and suspends the erase operation. ad- dresses are dont-cares when writing the erase sus- pend command. when the erase suspend command is written during a sector erase operation, the device requires a maximum of 20 s to suspend the erase operation. however, when the erase suspend command is written during the sector erase time-out, the device immediately ter- minates the time-out period and suspends the erase operation. after the erase operation has been suspended, the system can read array data from or program data to any sector not selected for erasure. (the device erase suspends all sectors selected for erasure.) normal read and write timings and command definitions apply. reading at any address within erase-suspended sec- tors produces status data on dq7Cdq0. the system can use dq7, or dq6 and dq2 together, to determine if a sector is actively erasing or is erase-suspended. see write operation status for information on these status bits. after an erase-suspended program operation is com- plete, the system can once again read array data within non-suspended sectors. the system can determine the status of the program operation using the dq7 or dq6 status bits, just as in the standard program oper- ation. see write operation status for more informa- tion.
16 am29lv081b the system may also write the autoselect command sequence when the device is in the erase suspend mode. the device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. when the device exits the autoselect mode, the device reverts to the erase suspend mode, and is ready for another valid operation. see autoselect command sequence for more information. the system must write the erase resume command (address bits are dont care) to exit the erase suspend mode and continue the sector erase operation. further writes of the resume command are ignored. another erase suspend command can be written after the de- vice has resumed erasing. notes: 1. see table 4 for erase command sequence. 2. see dq3: sector erase timer for more information. figure 4. erase operation start write erase command sequence data poll from system data = ffh? no yes erasure completed embedded erase algorithm in progress
am29lv081b 17 legend: x = dont care ra = address of the memory location to be read. rd = data read from location ra during read operation. pa = address of the memory location to be programmed. addresses latch on the falling edge of the we# or ce# pulse, whichever happens later. pd = data to be programmed at location pa. data latches on the rising edge of we# or ce# pulse, whichever happens first. sa = address of the sector to be verified (in autoselect mode) or erased. address bits a19Ca13 uniquely select any sector. notes: 1. see table 1 for description of bus operations. 2. all values are in hexadecimal. 3. except when reading array or autoselect data, all bus cycles are write operations. 4. all address bits are dont cares for unlock and command cycles, except when sa or pa required. 5. no unlock or command cycles required when reading array data. 6. the reset command is required to return to reading array data when device is in the autoselect mode, or if dq5 goes high (while the device is providing status data). 7. the fourth cycle of the autoselect command sequence is a read cycle. 8. the data is 00h for an unprotected sector and 01h for a protected sector. see autoselect command sequence for more information. 9. the unlock bypass command is required prior to the unlock bypass program command. 10. the unlock bypass reset command is required to return to reading array data when the device is in the unlock bypass mode. 11. the system may read and program in non-erasing sectors, or enter the autoselect mode, when in the erase suspend mode. the erase suspend command is valid only during a sector erase operation. 12. the erase resume command is valid only during the erase suspend mode. command definitions table 4. am29lv081b command definitions command sequence (note 1) cycles bus cycles (notes 2-4) first second third fourth fifth sixth addr data addr data addr data addr data addr data addr data read (note 5) 1 ra rd reset (note 6) 1 xxx f0 auto- select (note 7) manufacturer id 4 xxx aa xxx 55 xxx 90 x00 01 device id 4 xxx aa xxx 55 xxx 90 x01 38 sector protect verify (note 8) 4 xxx aa xxx 55 xxx 90 (sa) x02 00 xxx xxx xxx 01 program 4 xxx aa xxx 55 xxx a0 pa pd unlock bypass 3 xxx aa xxx 55 xxx 20 unlock bypass program (note 9) 2 xxx a0 xxx pd unlock bypass reset (note 10) 2 xxx 90 xxx 00 chip erase 6 xxx aa xxx 55 xxx 80 xxx aa xxx 55 xxx 10 sector erase 6 xxx aa xxx 55 xxx 80 xxx aa xxx 55 sa 30 erase suspend (note 11) 1 xxx b0 erase resume (note 12) 1 xxx 30
18 am29lv081b write operation status the device provides several bits to determine the sta- tus of a write operation: dq2, dq3, dq5, dq6, dq7, and ry/by#. table 5 and the following subsections de- scribe the functions of these bits. dq7, ry/by#, and dq6 each offer a method for determining whether a program or erase operation is complete or in progress. these three bits are discussed first. dq7: data# polling the data# polling bit, dq7, indicates to the host system whether an embedded algorithm is in progress or com- pleted, or whether the device is in erase suspend. data# polling is valid after the rising edge of the final we# pulse in the program or erase command sequence. during the embedded program algorithm, the device outputs on dq7 the complement of the datum pro- grammed to dq7. this dq7 status also applies to pro- gramming during erase suspend. when the embedded program algorithm is complete, the device outputs the datum programmed to dq7. the system must provide the program address to read valid status information on dq7. if a program address falls within a protected sector, data# polling on dq7 is active for ap- proximately 1 s, then the device returns to reading array data. during the embedded erase algorithm, data# polling produces a 0 on dq7. when the embedded erase al- gorithm is complete, or if the device enters the erase suspend mode, data# polling produces a 1 on dq7. this is analogous to the complement/true datum output described for the embedded program algorithm: the erase function changes all the bits in a sector to 1; prior to this, the device outputs the complement, or 0. the system must provide an address within any of the sectors selected for erasure to read valid status in- formation on dq7. after an erase command sequence is written, if all sec- tors selected for erasing are protected, data# polling on dq7 is active for approximately 100 s, then the de- vice returns to reading array data. if not all selected sectors are protected, the embedded erase algorithm erases the unprotected sectors, and ignores the se- lected sectors that are protected. when the system detects dq7 has changed from the complement to true data, it can read valid data at dq7C dq0 on the following read cycles. this is because dq7 may change asynchronously with dq0Cdq6 while output enable (oe#) is asserted low. figure 17, data# polling timings (during embedded algorithms), in the ac characteristics section illustrates this. table 5 shows the outputs for data# polling on dq7. figure 5 shows the data# polling algorithm. dq7 = data? yes no no dq5 = 1? no yes yes fail pass read dq7Cdq0 addr = va read dq7Cdq0 addr = va dq7 = data? start notes: 1. va = valid address for programming. during a sector erase operation, a valid address is an address within any sector selected for erasure. during chip erase, a valid address is any non-protected sector address. 2. dq7 should be rechecked even if dq5 = 1 because dq7 may change simultaneously with dq5. figure 5. data# polling algorithm
am29lv081b 19 ry/by#: ready/busy# the ry/by# is a dedicated, open-drain output pin that indicates whether an embedded algorithm is in progress or complete. the ry/by# status is valid after the rising edge of the final we# pulse in the command sequence. since ry/by# is an open-drain output, sev- eral ry/by# pins can be tied together in parallel with a pull-up resistor to v cc . if the output is low (busy), the device is actively erasing or programming. (this includes programming in the erase suspend mode.) if the output is high (ready), the device is ready to read array data (including during the erase suspend mode), or is in the standby mode. table 5 shows the outputs for ry/by#. figures 14, 15 and 16 shows ry/by# for reset, program, and erase operations, respectively. dq6: toggle bit i toggle bit i on dq6 indicates whether an embedded program or erase algorithm is in progress or complete, or whether the device has entered the erase suspend mode. toggle bit i may be read at any address, and is valid after the rising edge of the final we# pulse in the command sequence (prior to the program or erase op- eration), and during the sector erase time-out. during an embedded program or erase algorithm op- eration, successive read cycles to any address cause dq6 to toggle. the system may use either oe# or ce# to control the read cycles. when the operation is com- plete, dq6 stops toggling. after an erase command sequence is written, if all sec- tors selected for erasing are protected, dq6 toggles for approximately 100 s, then returns to reading array data. if not all selected sectors are protected, the em- bedded erase algorithm erases the unprotected sec- tors, and ignores the selected sectors that are protected. the system can use dq6 and dq2 together to deter- mine whether a sector is actively erasing or is erase- suspended. when the device is actively erasing (that is, the embedded erase algorithm is in progress), dq6 toggles. when the device enters the erase suspend mode, dq6 stops toggling. however, the system must also use dq2 to determine which sectors are erasing or erase-suspended. alternatively, the system can use dq7 (see the subsection on dq7: data# polling). if a program address falls within a protected sector, dq6 toggles for approximately 1 s after the program command sequence is written, then returns to reading array data. dq6 also toggles during the erase-suspend-program mode, and stops toggling once the embedded pro- gram algorithm is complete. table 5 shows the outputs for toggle bit i on dq6. fig- ure 6 shows the toggle bit algorithm. figure 18 in the ac characteristics section shows the toggle bit timing diagrams. figure 19 shows the differences between dq2 and dq6 in graphical form. see also the subsec- tion on dq2: toggle bit ii. dq2: toggle bit ii the toggle bit ii on dq2, when used with dq6, indi- cates whether a particular sector is actively erasing (that is, the embedded erase algorithm is in progress), or whether that sector is erase-suspended. toggle bit ii is valid after the rising edge of the final we# pulse in the command sequence. dq2 toggles when the system reads at addresses within those sectors that have been selected for era- sure. (the system may use either oe# or ce# to con- trol the read cycles.) but dq2 cannot distinguish whether the sector is actively erasing or is erase-sus- pended. dq6, by comparison, indicates whether the device is actively erasing, or is in erase suspend, but cannot distinguish which sectors are selected for era- sure. thus, both status bits are required for sector and mode information. refer to table 5 to compare outputs for dq2 and dq6. figure 6 shows the toggle bit algorithm in flowchart form, and the section dq2: toggle bit ii explains the algorithm. see also the dq6: toggle bit i subsection. figure 18 shows the toggle bit timing diagram. figure 19 shows the differences between dq2 and dq6 in graphical form. reading toggle bits dq6/dq2 refer to figure 6 for the following discussion. whenever the system initially begins reading toggle bit status, it must read dq7Cdq0 at least twice in a row to determine whether a toggle bit is toggling. typically, the system would note and store the value of the toggle bit after the first read. after the second read, the system would com- pare the new value of the toggle bit with the first. if the toggle bit is not toggling, the device has completed the program or erase operation. the system can read array data on dq7Cdq0 on the following read cycle. however, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the sys- tem also should note whether the value of dq5 is high (see the section on dq5). if it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as dq5 went high. if the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. if it is still toggling, the device did not completed the operation successfully, and the system must write the reset command to return to reading array data.
20 am29lv081b the remaining scenario is that the system initially de- termines that the toggle bit is toggling and dq5 has not gone high. the system may continue to monitor the toggle bit and dq5 through successive read cycles, de- termining the status as described in the previous para- graph. alternatively, it may choose to perform other system tasks. in this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of figure 6). dq5: exceeded timing limits dq5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. under these conditions dq5 produces a 1. this is a failure condition that indicates the program or erase cycle was not successfully completed. the dq5 failure condition may appear if the system tries to program a 1 to a location that is previously pro- grammed to 0. only an erase operation can change a 0 back to a 1. under this condition, the device halts the operation, and when the operation has ex- ceeded the timing limits, dq5 produces a 1. under both these conditions, the system must issue the reset command to return the device to reading array data. dq3: sector erase timer after writing a sector erase command sequence, the system may read dq3 to determine whether or not an erase operation has begun. (the sector erase timer does not apply to the chip erase command.) if additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase command. when the time-out is complete, dq3 switches from 0 to 1. if the time between additional sector erase com- mands from the system can be assumed to be less than 50 m s, the system need not monitor dq3. see also the sector erase command sequence section. after the sector erase command sequence is written, the system should read the status on dq7 (data# poll- ing) or dq6 (toggle bit i) to ensure the device has ac- cepted the command sequence, and then read dq3. if dq3 is 1, the internally controlled erase cycle has be- gun; all further commands (other than erase suspend) are ignored until the erase operation is complete. if dq3 is 0, the device will accept additional sector erase commands. to ensure the command has been accepted, the system software should check the status of dq3 prior to and following each subsequent sector erase command. if dq3 is high on the second status check, the last command might not have been ac- cepted. table 5 shows the outputs for dq3. start no yes yes dq5 = 1? no yes toggle bit = toggle? no program/erase operation not complete, write reset command program/erase operation complete read dq7Cdq0 toggle bit = toggle? read dq7Cdq0 twice read dq7Cdq0 notes: 1. read toggle bit twice to determine whether or not it is toggling. see text. 2. recheck toggle bit because it may stop toggling as dq5 changes to 1 . see text. figure 6. toggle bit algorithm (notes 1, 2) (note 1)
am29lv081b 21 table 5. write operation status notes: 1. dq5 switches to 1 when an embedded program or embedded erase operation has exceeded the maximum timing limits. see dq5: exceeded timing limits for more information. 2. dq7 and dq2 require a valid address when reading status information. refer to the appropriate subsection for further details. operation dq7 (note 2) dq6 dq5 (note 1) dq3 dq2 (note 2) ry/by# standard mode embedded program algorithm dq7# toggle 0 n/a no toggle 0 embedded erase algorithm 0 toggle 0 1 toggle 0 erase suspend mode reading within erase suspended sector 1 no toggle 0 n/a toggle 1 reading within non-erase suspended sector data data data data data 1 erase-suspend-program dq7# toggle 0 n/a n/a 0
22 am29lv081b absolute maximum ratings storage temperature plastic packages . . . . . . . . . . . . . . . C65 c to +150 c ambient temperature with power applied. . . . . . . . . . . . . . C65 c to +125 c voltage with respect to ground v cc (note 1) . . . . . . . . . . . . . . . . C0.5 v to +4.0 v a9 , oe# , and reset# (note 2). . . . . . . . . . . . C0.5 v to +12.5 v all other pins (note 1) . . . . . C0.5 v to v cc +0.5 v output short circuit current (note 3) . . . . . . 200 ma notes: 1. minimum dc voltage on input or i/o pins is C0.5 v. during voltage transitions, input or i/o pins may overshoot v ss to C2.0 v for periods of up to 20 ns. see figure 7. maximum dc voltage on input or i/o pins is v cc +0.5 v. during voltage transitions, input or i/o pins may overshoot to v cc +2.0 v for periods up to 20 ns. see figure 8. 2. minimum dc input voltage on pins a9, oe#, and reset# is C0.5 v. during voltage transitions, a9, oe#, and reset# may overshoot v ss to C2.0 v for periods of up to 20 ns. see figure 7. maximum dc input voltage on pin a9 is +12.5 v which may overshoot to 14.0 v for periods up to 20 ns. 3. no more than one output may be shorted to ground at a time. duration of the short circuit should not be greater than one second. stresses above those listed under absolute maximum ratings may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability. operating ranges commercial (c) devices ambient temperature (t a ) . . . . . . . . . . . 0c to +70c industrial (i) devices ambient temperature (t a ) . . . . . . . . . C40c to +85c extended (e) devices ambient temperature (t a ) . . . . . . . . C55c to +125c v cc supply voltages v cc for regulated voltage range. . . . .+3.0 v to +3.6 v v cc for full voltage range . . . . . . . . . .+2.7 v to +3.6 v operating ranges define those limits between which the func- tionality of the device is guaranteed. 20 ns 20 ns +0.8 v C0.5 v 20 ns C2.0 v figure 7. maximum negative overshoot waveform 20 ns 20 ns v cc +2.0 v v cc +0.5 v 20 ns 2.0 v figure 8. maximum positive overshoot waveform
am29lv081b 23
24 am29lv081b dc characteristics cmos compatible notes: 1. the i cc current listed is typically less than 2 ma/mhz, with oe# at v il . typical v cc is 3.0 v. 2. maximum i cc specifications are tested with v cc = v ccmax . 3. i cc active while embedded erase or embedded program is in progress. 4. automatic sleep mode enables the low power mode when addresses remain stable for t acc + 30 ns. 5. not 100% tested. parameter description test conditions min typ max unit i li input load current v in = v ss to v cc , v cc = v cc max 1.0 a i lit a9 input load current v cc = v cc max ; a9 = 12.5 v 35 a i lo output leakage current v out = v ss to v cc , v cc = v cc max 1.0 a i cc1 v cc active read current (notes 1, 2) ce# = v il, oe# = v ih 5 mhz 7 12 ma 1 mhz 2 4 i cc2 v cc active write current (notes 2, 3, 5) ce# = v il, oe# = v ih 15 30 ma i cc3 v cc standby current (note 2) ce#, reset# = v cc 0.3 v 0.2 5 a i cc4 v cc reset current (note 2) reset# = v ss 0.3 v 0.2 5 a i cc5 automatic sleep mode (notes 2, 4) v ih = v cc 0.3 v; v il = v ss 0.3 v 0.2 5 a v il input low voltage C0.5 0.8 v v ih input high voltage 0.7 x v cc v cc + 0.3 v v id voltage for autoselect and temporary sector unprotect v cc = 3.3 v 11.5 12.5 v v ol output low voltage i ol = 4.0 ma, v cc = v cc min 0.45 v v oh1 output high voltage i oh = C2.0 ma, v cc = v cc min 0.85 v cc v v oh2 i oh = C100 a, v cc = v cc min v cc C0.4 v lko low v cc lock-out voltage (note 5) 2.3 2.5 v
am29lv081b 25 dc characteristics (continued) zero power flash 20 15 10 5 0 0 500 1000 1500 2000 2500 3000 3500 4000 supply current in ma time in ns note: addresses are switching at 1 mhz figure 9. i cc1 current vs. time (showing active and automatic sleep currents) 10 8 2 0 12345 frequency in mhz supply current in ma note: t = 25 c figure 10. typical i cc1 vs. frequency 2.7 v 3.6 v 4 6
26 am29lv081b test conditions table 6. test specifications key to switching waveforms 2.7 k w c l 6.2 k w 3.3 v device under te s t figure 11. test setup note: diodes are in3064 or equivalent test condition -70 -90, -120 unit output load 1 ttl gate output load capacitance, c l (including jig capacitance) 30 100 pf input rise and fall times 5 ns input pulse levels 0.0C3.0 v input timing measurement reference levels 1.5 v output timing measurement reference levels 1.5 v waveform inputs outputs steady changing from h to l changing from l to h dont care, any change permitted changing, state unknown does not apply center line is high impedance state (high z) 3.0 v 0.0 v 1.5 v 1.5 v output measurement level input figure 12. input waveforms and measurement levels
am29lv081b 27 ac characteristics read operations notes: 1. not 100% tested. 2. see figure 11 figure 11and table 6table 6 for test specifications. parameter description speed option jedec std test setup -70 -90 -120 unit t avav t rc read cycle time (note 1) min 70 90 120 ns t avqv t acc address to output delay ce# = v il oe# = v il max 70 90 120 ns t elqv t ce chip enable to output delay oe# = v il max 70 90 120 ns t glqv t oe output enable to output delay max 30 35 50 ns t ehqz t df chip enable to output high z (note 1) max 25 30 30 ns t ghqz t df output enable to output high z (note 1) max 25 30 30 ns t oeh output enable hold time (note 1) read min 0 ns toggle and data# polling min 10 ns t axqx t oh output hold time from addresses, ce# or oe#, whichever occurs first (note 1) min 0 ns t ce outputs we# addresses ce# oe# high z output valid high z addresses stable t rc t acc t oeh t oe 0 v ry/by# reset# t df t oh figure 13. read operations timings
28 am29lv081b ac characteristics hardware reset (reset#) note: not 100% tested. parameter description all speed options jedec std test setup unit t ready reset# pin low (during embedded algorithms) to read or write (see note) max 20 s t ready reset# pin low (not during embedded algorithms) to read or write (see note) max 500 ns t rp reset# pulse width min 500 ns t rh reset# high time before read (see note) min 50 ns t rpd reset# low to standby mode min 20 s t rb ry/by# recovery time min 0 ns reset# ry/by# ry/by# t rp t ready reset timings not during embedded algorithms t ready ce#, oe# t rh ce#, oe# reset timings during embedded algorithms reset# t rp t rb figure 14. reset# timings
am29lv081b 29 ac characteristics erase/program operations notes: 1. not 100% tested. 2. see the erase and programming performance section for more information. parameter speed options jedec std description -70 -90 -120 unit t avav t wc write cycle time (note 1) min 70 90 120 ns t wlax t ah address hold time min 45 45 50 ns t dvwh t ds data setup time min 35 45 50 ns t wlwh t wp write pulse width min 35 35 50 ns t avwl t as address setup time min 0 ns t whdx t dh data hold time min 0 ns t oes output enable setup time min 0 ns t ghwl t ghwl read recovery time before write (oe# high to we# low) min 0 ns t elwl t cs ce# setup time min 0 ns t wheh t ch ce# hold time min 0 ns t whwl t wph write pulse width high min 30 ns t whwh1 t whwh1 programming operation (note 2) byte typ 9 s word typ 11 t whwh2 t whwh2 sector erase operation (note 2) typ 0.7 sec t vcs v cc setup time (note 1) min 50 s t rb recovery time from ry/by# min 0 ns t busy program/erase valid to ry/by# delay min 90 ns
30 am29lv081b ac characteristics oe# we# ce# v cc data addresses t ds t ah t dh t wp pd t whwh1 t wc t as t wph t vcs xxx pa pa read status data (last two cycles) a0h t cs status d out program command sequence (last two cycles) ry/by# t rb t busy t ch pa note: pa = program address, pd = program data, d out is the true data at the program address. figure 15. program operation timings
am29lv081b 31 ac characteristics oe# ce# addresses v cc we# data xxx sa t ah t wp t wc t as t wph 555h for chip erase 10 for chip erase 30h t ds t vcs t cs t dh 55h t ch in progress complete t whwh2 va va erase command sequence (last two cycles) read status data ry/by# t rb t busy note: sa = sector address (for sector erase), va = valid address for reading status data ( see write operation status). figure 16. chip/sector erase operation timings
32 am29lv081b ac characteristics we# ce# oe# high z t oe high z dq7 dq0Cdq6 ry/by# t busy complement true addresses va t oeh t ce t ch t oh t df va va status data complement status data true valid data valid data t acc t rc note: va = valid address. illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle. figure 17. data# polling timings (during embedded algorithms) we# ce# oe# high z t oe dq6/dq2 ry/by# t busy addresses va t oeh t ce t ch t oh t df va va t acc t rc valid data valid status valid status (first read) (second read) (stops toggling) valid status va note: va = valid address; not required for dq6. illustration shows first two status cycle after command sequence, last status read cycle, and array data read cycle. figure 18. toggle bit timings (during embedded algorithms)
am29lv081b 33 ac characteristics temporary sector unprotect note: not 100% tested. parameter all speed options jedec std description unit t vidr v id rise and fall time (see note) min 500 ns t rsp reset# setup time for temporary sector unprotect min 4 s note: the system may use ce# or oe# to toggle dq2 and dq6. dq2 toggles only when read at an address within an erase-suspended sector. figure 19. dq2 vs. dq6 enter erase erase erase enter erase suspend program erase suspend read erase suspend read erase we# dq6 dq2 erase complete erase suspend suspend program resume embedded erasing reset# t vidr 12 v 0 or 3 v ce# we# ry/by# t vidr t rsp program or erase command sequence 0 or 3 v figure 20. temporary sector unprotect timing diagram
34 am29lv081b ac characteristics sector protect: 150 s sector unprot ect: 15 ms 1 s reset# sa, a6, a1, a0 data ce# we# oe# 60h 60h 40h valid* valid* valid* status sector protect/unprotect verify v id v ih * for sector protect, a6 = 0, a1 = 1, a0 = 0. for sector unprotect, a6 = 1, a1 = 1, a0 = 0. figure 21. sector protect/unprotect timing diagram
am29lv081b 35 ac characteristics alternate ce# controlled erase/program operations notes: 1. not 100% tested. 2. see the erase and programming performance section for more information. parameter speed options jedec std description -70 -90 -120 unit t avav t wc write cycle time (note 1) min 70 90 120 ns t elax t ah address hold time min 45 45 50 ns t dveh t ds data setup time min 35 45 50 ns t eleh t cp ce# pulse width min 35 35 50 ns t avel t as address setup time min 0 ns t ehdx t dh data hold time min 0 ns t oes output enable setup time min 0 ns t ghel t ghel read recovery time before write (oe# high to we# low) min 0 ns t wlel t ws we# setup time min 0 ns t ehwh t wh we# hold time min 0 ns t ehel t cph ce# pulse width high min 30 ns t whwh1 t whwh1 programming operation (note 2) typ 9 s t whwh2 t whwh2 sector erase operation (note 2) typ 0.7 sec
36 am29lv081b ac characteristics t ghel t ws oe# ce# we# t ds data t ah addresses t dh t cp dq7# d out t wc t as t cph pa data# polling a0 for program 55 for erase t whwh1 or 2 t wh pd for program 30 for sector erase 10 for chip erase xxx for program xxx for erase pa for program sa for sector erase xxx for chip erase notes: 1. pa = program address, pd = program data, dq7# = complement of the data written to the device, d out = data written to the device. 2. figure indicates the last two bus cycles of the command sequence. figure 22. alternate ce# controlled write operation timings
am29lv081b 37 erase and programming performance notes: 1. typical program and erase times assume the following conditions: 25 c, 3.0 v v cc , 1,000,000 cycles. additionally, programming typicals assume checkerboard pattern. 2. under worst case conditions of 90c, v cc = 2.7 v, 1,000,000 cycles. 3. the typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. in the pre-programming step of the embedded erase algorithm, all bytes are programmed to 00h before erasure. 5. system-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. see table 4 for further information on command definitions. 6. the device has a minimum erase and program cycle endurance of 1,000,000 cycles. latchup characteristics includes all pins except v cc . test conditions: v cc = 3.0 v, one pin at a time. tsop pin capacitance notes: 1. sampled, not 100% tested. 2. test conditions t a = 25c, f = 1.0 mhz. data retention parameter typ (note 1) max (note 2) unit comments sector erase time 0.7 15 s excludes 00h programming prior to erasure (note 4) chip erase time 11 s byte programming time 9 300 s excludes system level overhead (note 5) chip programming time (note 3) 927s description min max input voltage with respect to v ss on all pins except i/o pins (including a9, oe#, and reset#) C1.0 v 12.5 v input voltage with respect to v ss on all i/o pins C1.0 v v cc + 1.0 v v cc current C100 ma +100 ma parameter symbol parameter description test setup typ max unit c in input capacitance v in = 0 6 7.5 pf c out output capacitance v out = 0 8.5 12 pf c in2 control pin capacitance v in = 0 7.5 9 pf parameter test conditions min unit minimum pattern data retention time 150 c 10 years 125 c 20 years
38 am29lv081b physical dimensions* ts 04040-pin standard tsop * for reference only. bsc is an ansi standard for basic space centering. dwg rev aa; 10/99
am29lv081b 39 physical dimensions * tsr04040-pin reverse tsop * for reference only. bsc is an ansi standard for basic space centering. dwg rev aa; 10/99
40 am29lv081b revision summary revision a (december 1997) first release. revision b (july 1998) expanded data sheet from advanced information to preliminary version. distinctive characteristics changed manufactured on 0.35 m process technology to manufactured on 0.32 m process technology. general description second paragraph: changed this device is manufac- tured using amds 0.35 m process technology to this device is manufactured using amds 0.32 m process technology. revision c (january 1999) distinctive characteristics added the following bullet: 20-year data retention at 125 c. ordering information valid combinations: replaced am29lv081b-100 with am29lv081b-90. dc characteristicscmos compatible i cc1 , i cc2 , i cc3 , i cc4 , i cc5 : added note 2 maximum i cc specifications are tested with v cc = v ccmax . revision c+1 (may 17, 1999) global in title of data sheet and in ordering information sec- tion, changed sector erase to uniform sector. revision d (november 19, 1999) ac characteristicsfigure 15. program operations timing and figure 16. chip/sector erase operations deleted t ghwl and changed oe# waveform to start at high. physical dimensions replaced figures with more detailed illustrations. corrected tsr04848-pin reverse tsop to tsr04040-pin reverse tsop. revision d+1 (november 8, 2000) global deleted burn-in option from ordering information sec- tion. added table of contents. trademarks copyright ? 2000 advanced micro devices, inc. all rights reserved. amd, the amd logo, and combinations thereof are registered trademarks of advanced micro devices, inc. expressflash is a trademark of advanced micro devices, inc. product names used in this publication are for identification purposes only and may be trademarks of their respective companies .

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